| Regress Pro - Spectroscopic ellipsometry and Reflectometry data analysis |
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| Tuesday, 30 August 2011 22:33 |
Regress Pro is a scientific and industrial software that can be used to study experimental data: the application lets you load spectroscopic data coming from an ellipsometer or reflectometer and analyze them using well-proven algorithms to determine various physical parameters like film's thickness or refractive index. Regress Pro lets you define a model of the film stack using a simple declarative language. You can also define a fit algorithm to analyze the data or, in alternative, perform an interactive fit of the data. Several models are available to define the dispersion curves of the materials and in addition some of the most common materials are provided in the library. The program has been developed mainly looking to the application of thin film measurement in semiconductor industry. The software is suitable both to determine the thickness of the layers and to determine the optical properties of dielectric materials. You will be also able to define a fit strategy well suited to the problem under analysis. With Regress Pro you will be able to determine the optical properties of unknown materials or, if you already know the materials, you can run simple fits to determine the thicknesses of the involved layers. To characterize the optical properties of the materials Regress Pro offers different optical models:
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Regress Pro is a scientific and industrial software that can be used to study experimental data: the application lets you load 

